Yoon’s group presented two research projects at the 61st Electronic Materials Conference (June 26 ~ June 28, 2019; University of Michigan, Ann Arbor, MI)
♦ Impact of Ar Ion Beam Milling on Surface Properties of Polycrystalline CdTe Solar Cells (David Magginetti, Seokmin Jeon, Yohan Yoon, Erfan Pourshaban, and Heayoung Yoon)
1. Materials Science and Engineering, University of Utah, Salt Lake City, UT 84112, USA
2. U.S. Naval Research Laboratory, Washington, DC 20375, USA
3. Electrical and Computer Engineering, University of Utah, Salt Lake City, UT 84112, USA
♦ Surface Potential Imaging of High-Aspect-Ratio Si Microwires Fabricated by Metal-assisted Chemical Etching Process (Erfan Pourshaban, Seokmin Jeon, Yohan Yoon, David Magginetti, and Heayoung Yoon)
1. Electrical and Computer Engineering, University of Utah, Salt Lake City, UT 84112, USA
2. U.S. Naval Research Laboratory, Washington, DC 20375, USA
3. Materials Science and Engineering, University of Utah, Salt Lake City, UT 84112, USA