A journal paper with Korea Aerospace University, Los Alamos National Lab, and other collaborators has been published. In this work, a high-resolution Kelvin probe force microscopy (KPFM) was used to study the heterogeneous electronic properties of 2D/3D materials (Ge film on MoS2). See the details here: https://aip.scitation.org/doi/full/10.1063/5.0075599.
