This year, the advanced Electron-Beam Microscopy class (ECE 6960-006) was extended to senior undergrad students (ECE 5960-007). The final project includes a poster presentation of individual students’ projects. The interdisciplinary course provides fundamental knowledge about the (scanning) electron microscopy and the practical lab sessions at Utah’s Nanofab. The best SEM image selected by the guests is “3D microstructured pillar array” taken by Dinorah Segovia (bottom left). Students, thank you for presenting your beautiful work.