
A collaborative work with NIST (National Institute of Standards and Technology) and LANL (Los Alamos National Laboratory) was presented at the M&M conference (Baltimore, MD).
https://doi.org/10.1017/S1431927618008498


A collaborative work with NIST (National Institute of Standards and Technology) and LANL (Los Alamos National Laboratory) was presented at the M&M conference (Baltimore, MD).
https://doi.org/10.1017/S1431927618008498
Dr. Yoon discussed the recent research progress made by Erfan and David, and shared the new project direction of her group.
A short video tutorial for Monte Carlo Simulation of Electron Trajectory in Solid, taught by Dean Collett. Dean, thank you for sharing the nice video with us!
Yoon’s group presented two research projects at the 60th EMC conference (June 27 ~ June 29, 2018; University of California, Santa Barbara, CA)
♦ Large-area MoTe2 Film Growth Using High-Vacuum Ampoule Process (David Magginetti, Xueling Cheng, Prashanth Gopalan, BerardiSensale-Rodriguez, and Heayoung Yoon)
♦ Local Photovoltage / NSOM Imaging of ZnTe/CdTe Back Contact (Yohan Yoon, David Magginetti, Erfan Pourshaban, Vasilios Palekis, Chih An Hsu, Mike Scarpulla, Chris Ferekides, and Heayoung Yoon)
We are excited about the new project related with a novel nanostructured PV/cooling system. We appreciate the support from the VPR office at the U.
Yang and Dean received their BS degree today. Lots of congratulations! Yang will continue her MS program at the U. Dean is seeking for a job near Salt Lake City. If you are looking for one of our best graduates (Dean’s list), here is one of them (Dean Collett: deanacollett@gmail.com).
“Wide-spectral/dynamic-range skin-compatible phototransistors enabled by floated heterojunction structures with surface functionalized SWCNTs and amorphous oxide semiconductors“, I. Hwang1, J. Kim1, M. Lee2, M. Lee1, H. Kim1, H. Kwon1, D. Hwang3, M. Kim4, H. Yoon5, Y. Kim2, and S. Park1, Nanoscale 9, 16711, 2017.
1. School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Korea
2. School of Advanced Materials Science and Engineering and SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon, Korea
3. Center for Opto-Electronic Materials and Devices, Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology (KIST), Seoul, Korea
4. Department of Chemistry, Chung-Ang University, Seoul, Korea
5. Department of Electrical and Computer Engineering, University of Utah, Salt Lake City, USA
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We welcome a new group member, Dr. Yohan Yoon. Yohan will continue working at CNST/NIST on the project of nanoscale local characterizations of PV devices and emerging semiconductor materials.
[ECE 6960-006] Advanced Electron Microscopy for Semiconductor Devices
Lecture: Wednesday / Thursday 2:00 pm ~ 2:50 pm
Prelab Friday 2:00 pm ~ 2: 50 pm
Lab: Tuesday (2-hour labs at the Nanofab; details: TBA)
Course Objectives
The goal of this course is to introduce the students to both the theory and practical use of modern scanning electron microscopy (SEM) for micro/nano materials and devices. We will start from the principle of electron microscopy, proceed to the description of conventional and advanced modern technique, and evaluate advantages and disadvantages of each method.